Network formalism for modeling functionally gradient piezoelectric plates and stacks and simulations of RAINBOW ceramic actuators

IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control

Volumn 48, Issue 2, 2001, Pages 462-476

  Ballato, John ^a,b   Schwartz, Robert ^a,b   Ballato, Arthur ^a,c  

^a IEEE   (United States)

^b CLEMSON UNIVERSITY   (United States)

^c US Army Communications and Electronics Command   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

MATERIAL PROPERTIES; OHMIC CONDUCTIVITY; PIEZOELECTRIC PLATES; REDUCED AND INTERNALLY BIASED OXIDE WAFER;

ACTUATORS; CIRCUIT THEORY; COMPUTER SIMULATION; DIELECTRIC LOSSES; ELECTRIC CONDUCTIVITY; ELECTRIC FIELDS;

PIEZOELECTRIC MATERIALS;

ARTICLE;

EID: 0035263381     PISSN: 08853010     EISSN: None     Source Type: Journal    
DOI: 10.1109/58.911729     Document Type: Article

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