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IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control

Volumn 48, Issue 2, 2001, Pages 432-444

Quantitative flaw reconstruction from ultrasonic surface wavefields measured by electronic speckle pattern interferometry

(2) Mast, T Douglas a,b Gordon, Grant A c

a IEEE (United States)

b PENNSYLVANIA STATE UNIVERSITY (United States)

c McDermott International Inc (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; COMPUTER SIMULATION; DEFECTS; GREEN'S FUNCTION; INTERFEROMETRY; PLATE METAL;

ELECTRONIC SPECKLE PATTERN INTERFEROMETRY; FLAW RECONSTRUCTION; SPATIAL FREQUENCY DOMAIN SPECTRUM; ULTRASONIC SURFACE WAVEFIELDS;

ULTRASONIC WAVES;

ARTICLE;

EID: 0035263315 PISSN: 08853010 EISSN: None Source Type: Journal
DOI: 10.1109/58.911726 Document Type: Article

Times cited : (25)

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