Measurements of the nonlinear refractive index of free-standing porous silicon layers at different wavelengths

Philosophical Magazine B: Physics of Condensed Matter; Statistical Mechanics, Electronic, Optical and Magnetic Properties

Volumn 81, Issue 2, 2001, Pages 133-139

  Lettieri, S ^a   Maddalena, P ^a   Odierna, L P ^a   Ninno, D ^a   La Ferrara, V ^b   Di Francia, G ^b  

^a UNIVERSITY OF NAPLES FEDERICO II   (Italy)

^b Centro Ricerche Fotovoltaiche   (Italy)

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EID: 0035262952     PISSN: 13642812     EISSN: None     Source Type: Journal    
DOI: 10.1080/13642810012470     Document Type: Article

References (25)