Characterization of light trapping in silicon films by spectral photoconductance measurements

Solar Energy Materials and Solar Cells

Volumn 66, Issue 1-4, 2001, Pages 187-193

  Campbell, Patrick ^a   Keevers, Mark ^a   Vogl, Bernhard ^a  

^a UNIVERSITY OF NEW SOUTH WALES   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

LIGHT ABSORPTION; LIGHT REFLECTION; OPTICAL VARIABLES MEASUREMENT; PHOTOCONDUCTING MATERIALS; THIN FILMS;

LIGHT TRAPPING; PHOTOCONDUCTANCE; SILICON FILMS;

SILICON SOLAR CELLS;

EID: 0035254623     PISSN: 09270248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0927-0248(00)00172-0     Document Type: Article

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