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Volumn 66, Issue 1-4, 2001, Pages 147-153

Modeling charge-carrier transport and generation-recombination mechanisms in p+n+ a-Si tunnel junctions

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE CARRIERS; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC CONTACTS; ELECTRIC FIELD EFFECTS; ELECTRON TRANSITIONS; ELECTRON TUNNELING; MATHEMATICAL MODELS; SEMICONDUCTOR JUNCTIONS; SOLAR CELLS;

EID: 0035254376     PISSN: 09270248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0927-0248(00)00167-7     Document Type: Article
Times cited : (2)

References (8)
  • 4
    • 0026748006 scopus 로고
    • An examination of the tunnel junctions in triple junction a-Si : H based solar cells: Modeling and effects on performance
    • J.Y. Hou, J.K. Arch, S.J. Fonash, An examination of the tunnel junctions in triple junction a-Si : H based solar cells: modeling and effects on performance, Proceedings of the 22th IEEE PVSC, 1991, pp. 1260-1264.
    • (1991) Proceedings of the 22th IEEE PVSC , pp. 1260-1264
    • Hou, J.Y.1    Arch, J.K.2    Fonash, S.J.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.