|
Volumn 66, Issue 1-4, 2001, Pages 147-153
|
Modeling charge-carrier transport and generation-recombination mechanisms in p+n+ a-Si tunnel junctions
a a a a |
Author keywords
[No Author keywords available]
|
Indexed keywords
CHARGE CARRIERS;
CURRENT VOLTAGE CHARACTERISTICS;
ELECTRIC CONTACTS;
ELECTRIC FIELD EFFECTS;
ELECTRON TRANSITIONS;
ELECTRON TUNNELING;
MATHEMATICAL MODELS;
SEMICONDUCTOR JUNCTIONS;
SOLAR CELLS;
THERMAL CAPTURE;
TUNNEL JUNCTIONS;
TUNNELING TRANSITIONS;
AMORPHOUS SILICON;
|
EID: 0035254376
PISSN: 09270248
EISSN: None
Source Type: Journal
DOI: 10.1016/S0927-0248(00)00167-7 Document Type: Article |
Times cited : (2)
|
References (8)
|