메뉴 건너뛰기




Volumn 66, Issue 1-4, 2001, Pages 11-15

Impact and options for boron diffusions in buried contact solar cells

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM ALLOYS; BORON; DIFFUSION IN SOLIDS; DOPING (ADDITIVES); PHOTOVOLTAIC EFFECTS; SILICON ALLOYS;

EID: 0035253966     PISSN: 09270248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0927-0248(00)00152-5     Document Type: Article
Times cited : (4)

References (7)
  • 2
    • 0028705179 scopus 로고
    • Back surface cell structures for reducing recombination in Cz silicon solar cells
    • R.R. King, K.W. Mitchell, J.M. Gee, "Back surface cell structures for reducing recombination in Cz silicon solar cells", First WCPEC 1994, pp. 1291-1294.
    • (1994) First WCPEC , pp. 1291-1294
    • King, R.R.1    Mitchell, K.W.2    Gee, J.M.3
  • 3
    • 84948611938 scopus 로고
    • "buried Contact Silicon Solar Cells"
    • Wenham S.R. "Buried Contact Silicon Solar Cells" Prog. Photovoltaics. 1:1993;3-10.
    • (1993) Prog. Photovoltaics , vol.1 , pp. 3-10
    • Wenham, S.R.1
  • 7
    • 0022306789 scopus 로고
    • Measurement of the emitter saturation current by a contactless photoconductivity decay method
    • D.E. Kane, R.M. Swanson, "Measurement of the emitter saturation current by a contactless photoconductivity decay method", 18th IEEE PVSC, 1985, pp. 578-583.
    • (1985) 18th IEEE PVSC , pp. 578-583
    • Kane, D.E.1    Swanson, R.M.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.