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Surface Science

Volumn 472, Issue 3, 2001, Pages

STM-induced void formation at the Al2O3/Ni3Al(1 1 1) interface

(5) Magtoto, N P a Niu, C a Anzaldua, M a Kelber, J A a Jennison, D R b

a UNIVERSITY OF NORTH TEXAS (United States)

b SANDIA NATIONAL LABORATORIES (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA; CERAMIC MATERIALS; CORROSION; CRYSTAL LATTICES; ELECTRIC CURRENTS; INTERFACES (MATERIALS); METAL INSULATOR BOUNDARIES; NICKEL ALLOYS; OXIDATION; PROBABILITY DENSITY FUNCTION; SCANNING TUNNELING MICROSCOPY; VACUUM;

VOID FRACTION;

METALLIC FILMS;

EID: 0035253113 PISSN: 00396028 EISSN: None Source Type: Journal
DOI: 10.1016/S0039-6028(00)00948-1 Document Type: Article

Times cited : (15)

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