Raman scattering and XRD analysis in argon ion implanted CdS thin films prepared by vacuum evaporation

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 173, Issue 4, 2001, Pages 475-482

  Senthil, K ^a   Mangalaraj, D ^a   Narayandass, Sa K ^a   Kesavamoorthy, R ^b   Reddy, G L N ^b  

^a Thin Film Laboratory   (India)

^b INDIRA GANDHI CENTRE FOR ATOMIC RESEARCH   (India)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; ARGON; CRYSTAL LATTICES; CRYSTAL ORIENTATION; DEPOSITION; EVAPORATION; FILM PREPARATION; ION IMPLANTATION; RAMAN SCATTERING; SEMICONDUCTING CADMIUM COMPOUNDS; THIN FILMS; VACUUM APPLICATIONS;

FULL WIDTH AT HALF MAXIMUM (FWHM); VACUUM EVAPORATION;

SEMICONDUCTING FILMS;

EID: 0035252262     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(00)00409-2     Document Type: Article

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