Scanning Acoustic Microscopy and SIMS investigation of CdTe detectors

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 458, Issue 1-2, 2001, Pages 431-436

  Barton, J ^a   Randles, T ^a   Hearne, S ^a   Barrett, J ^a   Kelly, P V ^a   Crean, G M ^a   Siffert, P ^b   Koebel, J M ^b  

^a UNIVERSITY COLLEGE CORK   (Ireland)

^b CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

DELAMINATION; METALLIZING; MICROSCOPIC EXAMINATION; SECONDARY ION MASS SPECTROMETRY; SEMICONDUCTING CADMIUM TELLURIDE;

SCANNING ACOUSTIC MICROSCOPY;

PARTICLE DETECTORS;

EID: 0035251262     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(00)00901-3     Document Type: Article

References (2)

1. Briggs A. Acoustic Microscopy. 1992;Oxford University Press, Oxford.
2. Sonix, Inc., Sonix HS1000 User's Guide, Spring field, VA 22152.