메뉴 건너뛰기




Volumn 458, Issue 1-2, 2001, Pages 568-579

Swept charge device, a novel CCD-based EDX detector: First results

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE COUPLED DEVICES; ENERGY DISPERSIVE SPECTROSCOPY; SEMICONDUCTING SILICON;

EID: 0035250849     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(00)00918-9     Document Type: Article
Times cited : (28)

References (13)
  • 3
    • 85031533689 scopus 로고    scopus 로고
    • EEV Ltd. Chelmsford, UK.
    • EEV Ltd. Chelmsford, UK.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.