The effect of dielectric loss in FDTD simulations of microstrip structures

IEEE Transactions on Microwave Theory and Techniques

Volumn 49, Issue 2, 2001, Pages 250-262

  Wittwer, David C ^a   Ziolkowski, Richard W ^b  

^a INTEL CORPORATION   (United States)

^b University of Arizona   (United States)

Author keywords

Finite difference methods; Microwave circuits; Microwave measurements; Numerical analysis

Indexed keywords

ABSORBING BOUNDARY CONDITIONS; MICROSTRIP STRUCTURES; TWO TIME DERIVATIVE LORENTZIAN MATERIAL;

BOUNDARY CONDITIONS; FINITE DIFFERENCE METHOD; MICROWAVE CIRCUITS; NUMERICAL ANALYSIS; THREE DIMENSIONAL; TIME DOMAIN ANALYSIS;

DIELECTRIC LOSSES;

EID: 0035250096     PISSN: 00189480     EISSN: None     Source Type: Journal    
DOI: 10.1109/22.903085     Document Type: Article

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