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0343674187
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note
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The substrate temperature is controlled with a commercial Pelletier effect module from the Comptoire Electronique du Languedoc company in France. The temperature can be varied between -20 and +80°C. The temperature of the module is maintained in this range by a home-made water circulation and voltage regulator.
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19
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0343238549
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note
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JSM 840A Instrument was used. By tilting the substrate at an angle α for the scan, the height, H, of the aggregates was determined from H = h/sin α where h is the height measured from the image.
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20
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0343238550
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note
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2. [21] X-ray reflectivity measurements were performed with a home made θ/2θ diffractometer using nickel-filtered Cu Kα (λ = 1.54 Å) radiation from a rotating anode source. The data were computer controlled and optimized with variable measuring times, attenuators, and power of the X-ray generator for different q vectors.
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