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Volumn 20, Issue 2, 2001, Pages 315-331
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Fast and accurate timing characterization using functional information
a
IEEE
(United States)
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Author keywords
Delay estimation; Mode analysis; Modeling; Timing characterization; Timing verification
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Indexed keywords
DEEP SUBMICROMETER INTEGRATED CIRCUIT;
DELAY ESTIMATION;
MODE DEPENDENT CHARACTERIZATION METHOD;
TIMING VERIFICATION;
ALGORITHMS;
CALCULATIONS;
DELAY CIRCUITS;
ELECTRIC NETWORK TOPOLOGY;
MATHEMATICAL MODELS;
MICROPROCESSOR CHIPS;
SEQUENTIAL CIRCUITS;
INTEGRATED CIRCUIT LAYOUT;
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EID: 0035248583
PISSN: 02780070
EISSN: None
Source Type: Journal
DOI: 10.1109/43.908474 Document Type: Article |
Times cited : (8)
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References (20)
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