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Volumn 40, Issue 2, 2001, Pages 295-302

Deformation detection on composite reflectance surfaces using two-image photometric stereo

Author keywords

Industrial inspection; Optical shape measurement; Photometric stereo; Reflectance models

Indexed keywords

ELECTROMAGNETIC WAVE BACKSCATTERING; LIGHT REFLECTION; MATHEMATICAL MODELS; PHOTOMETRY;

EID: 0035247905     PISSN: 00913286     EISSN: None     Source Type: Journal    
DOI: 10.1117/1.1339200     Document Type: Article
Times cited : (3)

References (14)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.