Self-tested self-synchronization circuit for mesochronous clocking

IEEE Transactions on Circuits and Systems II: Analog and Digital Signal Processing

Volumn 48, Issue 2, 2001, Pages 129-140

  Mu, Fenghao ^a,b   Svensson, Christer ^a,c  

^a IEEE

^b SwitchCore AB   (Sweden)

^c LINKÖPING UNIVERSITY   (Sweden)

Author keywords

Interconnection; Metastability; Self testing; Synchronization; Timing; VLSI

Indexed keywords

DATA TRANSFER; ELECTRIC POWER SUPPLIES TO APPARATUS; INTEGRATED CIRCUIT TESTING; LARGE SCALE SYSTEMS; SYNCHRONIZATION; VLSI CIRCUITS;

CLOCK FREQUENCY; MESOCHRONOUS CLOCKING; METASTABILITY; SELF TESTED SELF SYNCHRONIZATION CIRCUIT;

CMOS INTEGRATED CIRCUITS;

EID: 0035245686     PISSN: 10577130     EISSN: None     Source Type: Journal    
DOI: 10.1109/82.917781     Document Type: Article

References (29)