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Volumn 36, Issue 3-4, 2001, Pages 747-754
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Microstructural and electrical properties of MgO thin films grown on p-GaAs (100) substrates
a
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Author keywords
A. Semiconductors; A. Thin films; C. X ray diffraction
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
HETEROJUNCTIONS;
MAGNESIA;
METALLOGRAPHIC MICROSTRUCTURE;
PERMITTIVITY;
SEMICONDUCTING GALLIUM ARSENIDE;
SUBSTRATES;
SURFACE ROUGHNESS;
THIN FILMS;
X RAY CRYSTALLOGRAPHY;
CAPACITANCE-VOLTAGE MEASUREMENTS;
SEMICONDUCTING FILMS;
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EID: 0035245542
PISSN: 00255408
EISSN: None
Source Type: Journal
DOI: 10.1016/S0025-5408(01)00535-9 Document Type: Article |
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Times cited : (4)
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References (18)
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