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IEEE Transactions on Antennas and Propagation

Volumn 49, Issue 2, 2001, Pages 185-195

Efficient mode-matching analysis of discontinuities in finite planar substrates using perfectly matched layers

(4) Derudder, Henk b Olyslager, Frank a,b De Zutter, Daniel a,b Van Den Berghe, Steve b

a IEEE

b GHENT UNIVERSITY (Belgium)

Author keywords

Finite substrates; Mode matching; Perfectly matched layer (PML); Scattering; Surface waves

Indexed keywords

ANISOTROPY; ELECTROMAGNETIC WAVE REFLECTION; ELECTROMAGNETIC WAVE SCATTERING; FINITE DIFFERENCE METHOD; MONOLITHIC MICROWAVE INTEGRATED CIRCUITS; TIME DOMAIN ANALYSIS; WAVELET TRANSFORMS;

FINITE SUBSTRATE PLANAR CIRCUITS; PERFECTLY MATCHED LAYER;

SURFACE WAVES;

EID: 0035245527 PISSN: 0018926X EISSN: None Source Type: Journal
DOI: 10.1109/8.914270 Document Type: Article

Times cited : (103)

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