Effects of ceramic processing parameters on the microstructure and dielectric properties of (Ba1-xCax)(Ti0.99-y, ZryMn0.01)O3 sintered in a reducing atmosphere

Journal of Materials Science: Materials in Electronics

Volumn 12, Issue 2, 2001, Pages 123-130

  Lee, W H ^a   Tseng, T Y ^b   Hennings, D ^c  

^a Ceramic Material Development Department   (Taiwan)

^b NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

^c PHILIPS RESEARCH LABORATORIES   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL MICROSTRUCTURE; ELECTRIC POTENTIAL; GRAIN GROWTH; GRAIN SIZE AND SHAPE; OXIDES; PARTIAL PRESSURE; PERMITTIVITY; SINTERING; THERMAL EFFECTS;

CERAMIC PROCESSING PARAMETERS; SINTERING TEMPERATURE;

DIELECTRIC MATERIALS;

EID: 0035244785     PISSN: 09574522     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1011210422752     Document Type: Article

References (23)

1. "Ceramic dielectric and capacitor," Ch. 3