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Volumn 46, Issue 2-3, 2001, Pages 183-187

Application of confocal laser scanning microscopy, atomic force microscopy, and the profilometric method in quantitative fractography

Author keywords

Quantitative fractography; Sintered carbides

Indexed keywords

ATOMIC FORCE MICROSCOPY; FRACTOGRAPHY; FRACTURE; PROFILOMETRY; TUNGSTEN CARBIDE;

EID: 0035243285     PISSN: 10445803     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1044-5803(01)00122-X     Document Type: Article
Times cited : (5)

References (10)
  • 6
    • 0004084766 scopus 로고
    • 10 Years of quantitative fractography development (1983-1993)
    • in Polish
    • (1993) Inż Mater , vol.4 , pp. 89-99
    • Wojnar, L.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.