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Volumn 46, Issue 2-3, 2001, Pages 183-187
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Application of confocal laser scanning microscopy, atomic force microscopy, and the profilometric method in quantitative fractography
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Author keywords
Quantitative fractography; Sintered carbides
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
FRACTOGRAPHY;
FRACTURE;
PROFILOMETRY;
TUNGSTEN CARBIDE;
CONFOCAL LASER SCANNING MICROSCOPY;
SINTERED CARBIDES;
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EID: 0035243285
PISSN: 10445803
EISSN: None
Source Type: Journal
DOI: 10.1016/S1044-5803(01)00122-X Document Type: Article |
Times cited : (5)
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References (10)
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