Automatic recognition of complex microstructures using the Image Classifier

Materials Characterization

Volumn 46, Issue 2-3, 2001, Pages 87-92

  Komenda, Jacek ^a  

^a SWEREA KIMAB   (Sweden)

Author keywords

Contextual image analysis; Nickel based superalloy; Sintered steel

Indexed keywords

COMPUTER SOFTWARE; IMAGE ANALYSIS; OPTICAL MICROSCOPY; PARTICLE SIZE ANALYSIS; PHASE COMPOSITION; SCANNING ELECTRON MICROSCOPY; STEEL; SUPERALLOYS;

IMAGE CLASSIFIER (IC);

METALLOGRAPHIC MICROSTRUCTURE;

EID: 0035243181     PISSN: 10445803     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1044-5803(01)00106-1     Document Type: Article

References (6)

1. Statistisk klassifikation af billeder