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Volumn 115, Issue 1-2, 2001, Pages 129-134

Classification of counterfeit coins using multivariate analysis with X-ray diffraction and X-ray fluorescence methods

Author keywords

Cluster analysis; Counterfeit coins; Principal component analysis; X ray diffraction; X ray fluorescence

Indexed keywords

COPPER; IRON; NICKEL; ZINC;

EID: 0035219852     PISSN: 03790738     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0379-0738(00)00309-1     Document Type: Article
Times cited : (27)

References (4)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.