Charge-carrier transport in nanometer-sized periodic Si/CaF2 structures with participation of traps

Semiconductors

Volumn 35, Issue 1, 2001, Pages 112-116

  Berashevich, Yu A ^a   Danilyuk, A L ^a   Kholod, A N ^a   Borisenko, V E ^a  

^a BELARUSIAN STATE UNIVERSITY OF INFORMATICS AND RADIOELECTRONICS   (Belarus)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0035218666     PISSN: 10637826     EISSN: None     Source Type: Journal    
DOI: 10.1134/1.1340300     Document Type: Article

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