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Volumn 3, Issue 8, 2001, Pages 1331-1337
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Misfit accommodation of epitaxial La1-xAxMnO3 (A=Ca, Sr) thin films
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Author keywords
CMR thin films; Crystal structure; Electron microscopy; Stress relaxation
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Indexed keywords
FERROMAGNETIC MATERIAL;
MANGANESE OXIDE;
PEROVSKITE;
COMPRESSIVE STRENGTH;
CONFERENCE PAPER;
CRYSTAL STRUCTURE;
CRYSTALLIZATION;
ELASTICITY;
ELECTRON MICROSCOPY;
FILM;
STRESS STRAIN RELATIONSHIP;
TENSILE STRENGTH;
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EID: 0035215263
PISSN: 14666049
EISSN: None
Source Type: Journal
DOI: 10.1016/S1466-6049(01)00155-6 Document Type: Conference Paper |
Times cited : (3)
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References (13)
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