Lattice strain in the epitaxial thin films of perovskites

International Journal of Inorganic Materials

Volumn 3, Issue 8, 2001, Pages 1303-1305

  Gorbenko, O Yu ^a   Novojilov, M A ^a   Graboy, I E ^a   Amelichev, V A ^a   Bosak, A A ^a   Nikulin, I V ^a   Kaul, A R ^a   Guettler, B ^b   Wahl, G ^c   Babushkina, N A ^d   Belova, L M ^d   Zandbergen, H W ^e  

^a MOSCOW STATE UNIVERSITY   (Russian Federation)

^b PHYSIKALISCH TECHNISCHE BUNDESANSTALT   (Germany)

^c TECHNICAL UNIVERSITY OF BRAUNSCHWEIG   (Germany)

^d KURCHATOV INSTITUTE   (Russian Federation)

^e DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

HREM; Lattice strain; MOCVD; Perovskites; Raman spectrometry; XRD

Indexed keywords

PEROVSKITE;

ANISOTROPY; CONFERENCE PAPER; CRYSTAL STRUCTURE; ELECTRIC CONDUCTIVITY; FILM; RAMAN SPECTROMETRY; STOICHIOMETRY; STRESS STRAIN RELATIONSHIP; STRUCTURE ANALYSIS;

EID: 0035212118     PISSN: 14666049     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1466-6049(01)00144-1     Document Type: Conference Paper

References (13)