Analysis of trapping parameters in surface layer of solid insulating materials

IEEE International Conference on Conduction and Breakdown in Solid Dielectrics

Volumn , Issue , 2001, Pages 236-239

  Zhang, G J ^a   Wang, X R ^a   Yan, Z ^a  

^a XI'AN JIAOTONG UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMISORPTION; CURRENT DENSITY; ELECTRIC FIELD EFFECTS; ELECTRON TRAPS; FLASHOVER; POLYTETRAFLUOROETHYLENES;

ELECTRIC STRESSES;

ELECTRIC INSULATING MATERIALS;

EID: 0035201324     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (13)

1. Solid insulators in vacuum: A review
2. Flashover of insulators in vacuum: Review of the phenomena and techniques to improve holdoff voltage
3. Influence of electrode contact on luminescence from alumina ceramic surface under ac electric field in vacuum
4. Development process of surface flashover along alumina ceramics under ac voltage in vacuum
5. Optical studies of surface discharge under dc voltage in vacuum
6. Optical studies of surface discharge under dc voltage in vacuum
7. A decay process of surface electric charges across polyethylene film
8. Charge trapping in corona-charged polyethylene films
9. Double-carrier injection and recombination in insulators, including diffusion effects
10. Properties of the metal-polymer interface observed with space-charge mapping techniques
11. Theory of isothermal currents and the direct determination of trap parameters in semiconductors and insulators containing arbitrary trap distributions