Electrical properties of field grading materials influenced by the silicon carbide grain size

IEEE International Conference on Conduction and Breakdown in Solid Dielectrics

Volumn , Issue , 2001, Pages 43-45

  Onneby C ^a   Martensson E ^a   Gafvert U ^a   Gustafsson, A ^a   Palmqvist, L ^a  

^a ABB CORPORATE RESEARCH   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

COMPRESSION MOLDING; CROSSLINKING; DEGASSING; FILLERS; FREQUENCY DOMAIN ANALYSIS; GRAIN SIZE AND SHAPE; PERMITTIVITY; SEMICONDUCTOR DOPING; SILICON CARBIDE; STRESS CONCENTRATION; TIME DOMAIN ANALYSIS; VULCANIZATION;

FIELD GRADING MATERIALS;

SYNTHETIC RUBBER;

EID: 0035197970     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)

1. Stress control tubes for HV cable terminations with linear and non-linear characteristics: Theoretical and experimental approaches
2. Stress grading for high voltage motor and generator coils
3. Improvements in stress control materials
4. Electrical properties of field grading materials with silicon carbide and carbon black
5. Measurement techniques for dielectric response characterisation at low frequencies
6. AC-characteristics of SiC powder