Establishing a Demerit count reference standard for the classification and grading of leather hides

International Journal of Advanced Manufacturing Technology

Volumn 18, Issue 10, 2001, Pages 731-738

  Yeh, C ^a   Perng, D B ^b  

^a FENG CHIA UNIVERSITY   (Taiwan)

^b NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

Author keywords

Demerit count; Image processing; Leather surface defects; Machine vision; Wet blue hide

Indexed keywords

COMPUTER VISION; DEFECTS; GRADING; IMAGE PROCESSING; PERFORMANCE; SHOE MANUFACTURE; STANDARDS; STATISTICAL METHODS; SURFACES;

DEMERIT COUNT; LEATHER HIDES; SURFACE DEFECTS;

LEATHER;

EID: 0035195470     PISSN: 02683768     EISSN: None     Source Type: Journal    
DOI: 10.1007/s001700170016     Document Type: Article

References (15)

1. The specifications detect of wet end operations
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8. Defect detection on leather by oriented singularities
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11. Establishing compensatory leather defect area standards
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