Fault injection emulator for field programmable gate arrays

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4525, Issue , 2001, Pages 1-9

  Slaughter, Thomas ^a   Stroud, Charles ^a   Emmert, John ^a   Skaggs, Brandon ^b  

^a University of North Carolina at Charlotte   (United States)

^b UNIVERSITY OF KENTUCKY   (United States)

Author keywords

Diagnostic evaluation; Fault and defect distribution; Fault emulation; Fault tolerant evaluation; Test evaluation

Indexed keywords

COMPUTATIONAL COMPLEXITY; COMPUTER SIMULATION; FAILURE ANALYSIS; FILE ORGANIZATION;

FAULT INJECTION EMULATOR; TEST EVALUATION;

FIELD PROGRAMMABLE GATE ARRAYS;

EID: 0035179872     PISSN: 0277786X     EISSN: None     Source Type: Journal    
DOI: 10.1117/12.434369     Document Type: Article

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