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Volumn 378-381, Issue I, 2001, Pages 154-159
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Peculiarities of the X-ray powder diffraction patterns from FCC crystals containing a high concentration of random deformation stacking faults
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Author keywords
Deformation stacking faults; FCC crystal; Powder diffraction patterns
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Indexed keywords
CALCULATIONS;
COMPUTER SIMULATION;
CRYSTAL DEFECTS;
CRYSTAL STRUCTURE;
HARMONIC ANALYSIS;
X RAY POWDER DIFFRACTION;
RANDOM DEFORMATION STACKING FAULT;
WARREN-AVERBACHS METHOD;
MATERIALS SCIENCE;
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EID: 0035179332
PISSN: 02555476
EISSN: 16629752
Source Type: Book Series
DOI: 10.4028/www.scientific.net/msf.378-381.154 Document Type: Conference Paper |
Times cited : (2)
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References (18)
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