Applicability of the enlargement law and the Weibull distribution to the breakdown in SF6

Conference on Electrical Insulation and Dielectric Phenomena (CEIDP), Annual Report

Volumn , Issue , 2001, Pages 436-440

  Finkel, M ^a   Boeck, W ^a  

^a TECHNICAL UNIVERSITY OF MUNICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC INSULATION; ELECTRIC LINES; ELECTRIC POTENTIAL; ELECTRIC SWITCHGEAR; PROBABILITY DISTRIBUTIONS; WEIBULL DISTRIBUTION;

NEGATIVE LIGHTING IMPULSE VOLTAGE;

ELECTRIC BREAKDOWN OF GASES;

EID: 0035175921     PISSN: 00849162     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)

1. 6-insulation breakdown behaviour under impulse stress
2. 6
3. A charge simulation method for the calculation of high voltage fields
4. Statistical techniques for high-voltage engineering
5. 6