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Volumn , Issue , 2001, Pages 223-226

Comparisons of technologies and MMICs results for military needs

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONIC WARFARE; HETEROJUNCTION BIPOLAR TRANSISTORS; PASSIVATION; POWER AMPLIFIERS;

EID: 0035175773     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (4)

References (4)
  • 1
    • 0032321094 scopus 로고    scopus 로고
    • Migration from an AlGaAs to an InGaP emitter Process for improved reliability
    • (1998) IEEE , pp. 153-156
    • Low, T.S.1
  • 3
    • 0006570921 scopus 로고    scopus 로고
    • Arrhenius law limits used with electronic components reliability tests
    • (1999) ASTELAB , pp. 1-5
    • Gigoux, C.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.