Electrical conductivity of soybean seeds after storage in several environments

Seed Science and Technology

Volumn 29, Issue 3, 2001, Pages 599-608

  Vieira, R D ^a   Tekrony, D M ^b   Egli, D B ^b   Rucker, M ^b  

^a SÃO PAULO STATE UNIVERSITY UNESP   (Brazil)

^b UNIVERSITY OF KENTUCKY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0035173404     PISSN: 02510952     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (19)

1. Cellular events during germination and seedling growth
2. The dynamics of seed mortality
3. Deterioration of soybean seeds in storage
4. Seedbed conditions and prediction of field emergence of soybean seed
5. Relationship between seed vigor and the storability of soybean seed
6. Reduction of summer storage temperatures to improve carry over quality of soybean seed
7. Bulk conductivity test variables for mungbean, soybean and French bean seed lot
8. International rules for seed testing
9. The bulk conductivity test as an indicator of soybean seed quality
10. Electrical conductivity test
11. The Maillard reaction and oxidative stress during aging of soybean seeds
12. Factors causing variations in the conductivity test for soybean seeds
13. Predicting soybean seed germination during warehouse storage
14. Relevance of Amadori and Maillard reaction to seed deterioration
15. Effect of common bean and soybean genotypes on the electrical conductivity of seed