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Volumn 20, Issue 1, 2001, Pages 11-19
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Potentiometry at trace levels
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Author keywords
Ion selective electrode; Lower detection limit; Speciation; Trace level analysis
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Indexed keywords
TRACE ELEMENT;
ION SELECTIVE ELECTRODE;
MEASUREMENT;
POTENTIOMETRY;
PRIORITY JOURNAL;
REVIEW;
TECHNOLOGY;
VALIDATION PROCESS;
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EID: 0035172561
PISSN: 01659936
EISSN: None
Source Type: Journal
DOI: 10.1016/S0165-9936(00)00056-X Document Type: Review |
Times cited : (134)
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References (35)
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