Effects of reflow processing and flux residue on ionic migration of lead-free solder plating using the Quartz Crystal Microbalance method

Materials Transactions

Volumn 42, Issue 9, 2001, Pages 2003-2007

  Tanaka, H ^a   Ueta, F ^a   Yoshihara, S ^a   Shirakashi, T ^a  

^a UTSUNOMIYA UNIVERSITY   (Japan)

Author keywords

Flux; Ionic migration; Lead free solder; Quartz crystal microbalance; Reflow

Indexed keywords

CRYSTALS; DISSOLUTION; ELECTRODES; FLUXES; PLATING; QUARTZ;

REFLOW PROCESSING;

SOLDERING ALLOYS;

EID: 0035171683     PISSN: 13459678     EISSN: None     Source Type: Journal    
DOI: 10.2320/matertrans.42.2003     Document Type: Article

References (5)