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Volumn 17, Issue 11, 2001, Pages 1353-1359
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Texture development in cold rolled and annealed C-Mn-Si and C-Mn-Al-Si TRIP steels
a
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Author keywords
[No Author keywords available]
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Indexed keywords
ALUMINUM;
CARBON;
FERRITE;
MANGANESE;
SILICON;
STEEL;
ARTICLE;
COLD;
ELECTRON;
ELECTRON BACKSCATTERING DIFFRACTION;
IMAGE QUALITY;
IRON AND STEEL INDUSTRY;
MATERIAL STATE;
MATERIALS;
MEASUREMENT;
STRUCTURE ANALYSIS;
TEMPERATURE;
X RAY DIFFRACTION;
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EID: 0035165833
PISSN: 02670836
EISSN: None
Source Type: Journal
DOI: 10.1179/026708301101509557 Document Type: Article |
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Times cited : (42)
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References (12)
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