Mechanical stress caused frequency drift in cryogenic sapphire resonators

Proceedings of the Annual IEEE International Frequency Control Symposium

Volumn , Issue , 2001, Pages 710-714

  Chang, S ^a   Mann, A G ^b  

^a Bliley Technologies Inc   (United States)

^b UNIVERSITY OF WESTERN AUSTRALIA   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

CRYOGENICS; ELECTROMAGNETIC FIELD EFFECTS; FREQUENCY STABILITY; OSCILLATORS (ELECTRONIC); PERMITTIVITY; SAPPHIRE; STRESSES;

MOUNTING STRUCTURES;

RESONATORS;

EID: 0035165013     PISSN: 01616404     EISSN: None     Source Type: Journal    
DOI: 10.1109/FREQ.2001.956368     Document Type: Article

References (10)

1. Latest results of UWA cryogenic sapphire oscillator
2. Ultrastable and ultralow phase noise microwave sapphire oscillators
3. Improved cryogenic sapphire oscillator with exceptionally high frequency stability
4. Cryogenic sapphire oscillator with improved frequency stability
5. Resonant frequencies of higher order modes in cylindrical anisotropic dielectric resonators
6. Use of whispering-gallery modes for complex permittivity dertiminations of ultra-low-loss dielectric materials
7. Pressure variation of low frequency dielectric constants of some anisotropic crystals
8. Parametric interaction of the electric and acoustic fields in a sapphire mono-crystal transducer with a microwave readout