Growth and X -ray characterization of ScFe4Al8 single crystals

Crystal Research and Technology

Volumn 36, Issue 8-10, 2001, Pages 1119-1122

  Talik, E ^a   Winiarski, A ^a   Kotur, B ^b   Suski, W ^c,d  

^a UNIVERSITY OF SILESIA   (Poland)

^b IVAN FRANKO NATIONAL UNIVERSITY OF LVIV   (Ukraine)

^c INSTITUTE OF LOW TEMPERATURE AND STRUCTURE RESEARCH   (Poland)

^d INTERNATIONAL LABORATORY OF HIGH MAGNETIC FIELDS AND LOW TEMPERATURES   (Poland)

Author keywords

Intermetallic compound; Single crystal growth; X ray topography

Indexed keywords

CRYSTAL GROWTH; REFLECTION; SCANDIUM COMPOUNDS; X RAY POWDER DIFFRACTION;

REFLECTION TOPOGRAPHIES;

SINGLE CRYSTALS;

EID: 0035162037     PISSN: 02321300     EISSN: None     Source Type: Journal    
DOI: 10.1002/1521-4079(200110)36:8/10<1119::AID-CRAT1119>3.0.CO;2-X     Document Type: Article

References (3)

1. KOTUR, B., YU., BADURSKI, D., SUSKI, W., WOCHOWSKI, K., GILEWSKI, A., MYDLARZ, T.: Physica 6254 (1998) 107.
2. SCHOBINGER-PAPAMANTELLOS, P. BUSCHOW, K.H.J., RITTER, C.: J.Magn. Magn. Mater. 186 (1998) 21.
3. SUSKI, W., in: K.A. Gschneidner Jr., L. Eyring (Eds.): Handbook on the Physics and Chemistry of Rare Earths, vol. 22, Elsevier, Amsterdam, 1996, p. 143 (Chapter 149).