Single event latchup and total dose testing of spacecraft electronic components

IEEE Radiation Effects Data Workshop

Volumn , Issue , 2001, Pages 100-105

  Warren, K ^a   Roth, D ^a   Kinnison, J ^a   Carkuff, B ^a  

^a JOHNS HOPKINS UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DELAY CIRCUITS; DIGITAL INTEGRATED CIRCUITS; ELECTRIC CURRENTS; ELECTRIC INVERTERS; ELECTRIC POTENTIAL; SEMICONDUCTOR DEVICE TESTING; SPACE APPLICATIONS; VOLTAGE REGULATORS;

DEVICE UNDER TEST (DUT); SINGLE EVENT LATCHUP (SEL);

SPACECRAFT EQUIPMENT;

EID: 0035162029     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (0)