SEE evaluation of digital analog converters for space applications

IEEE Radiation Effects Data Workshop

Volumn , Issue , 2001, Pages 62-66

  Scheick, L Z ^a  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DELAY CIRCUITS; ELECTRIC POWER SUPPLIES TO APPARATUS; ELECTRONIC EQUIPMENT TESTING; HEAVY IONS; NETWORK PROTOCOLS; PERSONAL COMPUTERS; SPACE APPLICATIONS; TIMING CIRCUITS;

SINGLE EVENT EFFECT (SEE);

DIGITAL TO ANALOG CONVERSION;

EID: 0035161861     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (2)

1. Single event effect and radiation damage results for candidate spacecraft electronics
2. SEU cross sections derived from A diffusion analysis