80nm SOI CMOS parameter extraction for BSIMPD

IEEE International SOI Conference

Volumn , Issue , 2001, Pages 55-56

  Goto, K ^a   Su, P ^a   Tagawa, Y ^a   Sugii, T ^a   Hu, C ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; CURRENT VOLTAGE CHARACTERISTICS; HEAT RESISTANCE; SILICON ON INSULATOR TECHNOLOGY; VLSI CIRCUITS;

PARAMETER EXTRACTION;

CMOS INTEGRATED CIRCUITS;

EID: 0035158802     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (4)