Growth, characterization and surface cleaning procedures for high-purity tungsten single crystals

Journal of Crystal Growth

Volumn 222, Issue 1-2, 2001, Pages 154-162

  Cortenraad, R ^a   Ermolov, S N ^a,b   Semenov, V N ^b   Denier Van Der Gon, A W ^a   Glebovsky, V G ^a,b   Bozhko, S I ^b   Brongersma, H H ^a  

^a EINDHOVEN UNIVERSITY OF TECHNOLOGY   (Netherlands)

^b INSTITUTE OF SOLID STATE PHYSICS   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CRYSTAL GROWTH; CRYSTAL IMPURITIES; CRYSTAL ORIENTATION; CRYSTALLOGRAPHY; ELECTRON BEAM MELTING; LOW ENERGY ELECTRON DIFFRACTION; SINGLE CRYSTALS; STRAIN; SURFACE CLEANING; X RAY CRYSTALLOGRAPHY;

BORRMANN EFFECT; ELECTRON BEAM FLOATING ZONE MELTING;

TUNGSTEN;

EID: 0035155547     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(00)00876-9     Document Type: Article

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