Processing of CdTe thin films by the stacked elemental layer method: Compound formation and physical properties

Materials Letters

Volumn 47, Issue 1-2, 2001, Pages 63-70

  Cruz, L R ^a   Matson, R ^b   De Avillez, R R ^c  

^a MILITARY INSTITUTE OF ENGINEERING   (Brazil)

^b NATIONAL RENEWABLE ENERGY LABORATORY   (United States)

^c PONTIFICAL CATHOLIC UNIVERSITY OF RIO DE JANEIRO   (Brazil)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; ATOMIC FORCE MICROSCOPY; DEPOSITION; LIGHT REFLECTION; LIGHT TRANSMISSION; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING CADMIUM TELLURIDE; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

STACKED ELEMENTAL LAYER (SEL) METHOD;

SEMICONDUCTING FILMS;

EID: 0035155422     PISSN: 0167577X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0167-577X(00)00213-5     Document Type: Article

References (13)

1. Chu T.L., Chu S.S. Prog. Photovoltaics. 1:1993;31.
2. McCandless B.E., Birkmire R.W. Sol. Cells. 31:1991;527.
3. Moutinho H.R., Hasoon F.S., Abulfotuh F., Kazmerski L.L. J. Vac. Sci. Technol., A. 13(6):1995;2877.
4. Carter M.J., I'Anson I., Knowles A., Hill R. Proceedings of the 19th IEEE Photovoltaic Specialists Conference, New Orleans, May. 1987;1275. edited by IEEE (New York, 1987).
5. Bhatti M.T., Hynes K.M., Miles R.W., Hill R. Int. J. Sol. Energy. 12:1992;171.
6. Miles R.W., Bhatti M.T., Hynes K.M., Baumann A.E., Hill R. Mater. Sci. and Eng., B. 16:1993;250.
7. Cruz L.R., Kazmerski L.L., Moutinho H.R., Hasoon F., Dhere R.G., de Avillez R.R. Thin Solid Films. 350(1-2):1999;40.
8. Slimani T., Goudeau P., Naudon A. J. Appl. Crystallorg. 24:1991;638.
9. James R.W. The Optical Principles of the Diffraction of X-Rays. 1950;54 G. Bell and Sons, London.
10. Kidson G.V. J. Nucl. Mater. 3(1):1961;21.
11. Gösele U., Tu K.N. J. Appl. Phys. 53:1982;3252.
12. Pankove J.I. Optical Process in Semiconductors. 1971;93 Dover Publications, New York.
13. Basol B.M. Int. J. Sol. Energy. 12:1992;25.