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Rapid Communications in Mass Spectrometry

Volumn 15, Issue 1, 2001, Pages 1-7

Secondary ion mass spectrometry in the characterisation of boron-based ceramics

(6) Daolio, S a Fabrizio, M a Piccirillo, C a Muolo, M L a Passerone, A a Bellosi, A a

a CNR (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

BORON; BORON CARBIDE; CERAMIC MATERIALS; INTERFACES (MATERIALS); NICKEL; SECONDARY EMISSION; TITANIUM COMPOUNDS; ZIRCONIA;

CERAMIC SAMPLES; CERAMIC/METAL INTERFACE; CU DIFFUSION; HYDROGEN ABSORPTION; INTERFACE REGIONS; NICKEL ADDITION; OXYGEN ABSORPTION; SECONDARY ION-MASS SPECTROMETRY; SPECTROMETRY MEASUREMENTS; TI-BASED;

SECONDARY ION MASS SPECTROMETRY;

BORON; BORON DERIVATIVE; COPPER; ZIRCONIUM;

ARTICLE; CERAMICS; DIFFUSION; ITALY; MASS SPECTROMETRY; MOLECULAR INTERACTION;

EID: 0035152435 PISSN: 09514198 EISSN: None Source Type: Journal
DOI: 10.1002/1097-0231(20010115)15:1<1::AID-RCM183>3.0.CO;2-I Document Type: Article

Times cited : (9)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.