Structural characterization of nickel tantalum oxide synthesized by sol-gel spin coating technique

Materials Letters

Volumn 47, Issue 1-2, 2001, Pages 20-24

  Phani, A Ratna ^a   Santucci, S ^a  

^a UNIVERSITY OF L'AQUILA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; ATOMIC FORCE MICROSCOPY; CRYSTAL ORIENTATION; FILM PREPARATION; NICKEL COMPOUNDS; PHASE TRANSITIONS; SILICON; SOL-GELS; SUBSTRATES; THIN FILMS; X RAY DIFFRACTION ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY;

GRAZING INCIDENCE X RAY DIFFRACTION (GIXRD); SOL-GEL SPIN COATING TECHNIQUES; TAPPING MODE ATOMIC FORCE MICROSCOPY (TMAFM);

METALLIC FILMS;

EID: 0035151383     PISSN: 0167577X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0167-577X(00)00205-6     Document Type: Article

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