Extended X-ray absorption fine structure study of Mn ultrathin films grown on Cu(1 0 0)

Surface Science

Volumn 471, Issue 1-3, 2001, Pages 203-208

  D'Addato, S ^a   Finetti, P ^b  

^a UNIVERSITY OF MODENA AND REGGIO EMILIA   (Italy)

^b QUEEN'S UNIVERSITY BELFAST   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION SPECTROSCOPY; COPPER; CRYSTAL LATTICES; FILM GROWTH; LOW ENERGY ELECTRON DIFFRACTION; MAGNETIC THIN FILMS; MANGANESE; STRAIN; ULTRATHIN FILMS; X RAY SPECTROSCOPY;

EXTENDED X RAY ABSORPTION FINE STRUCTURE (EXAFS) SPECTROSCOPY;

METALLIC FILMS;

EID: 0035148176     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(00)00907-9     Document Type: Article

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