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Volumn 201, Issue 1, 2001, Pages 1-32

Electron probe microanalysis using soft X-rays - A review. Part 1: Instrumentation, spectrum processing and detection sensitivity

Author keywords

Analysis; Electron probe microanalysis; Energy dispersive; Soft X ray; Spectrometry; Wavelength dispersive

Indexed keywords

DISPERSION (WAVES); ELECTRON PROBE MICROANALYSIS;

EID: 0035137217     PISSN: 00222720     EISSN: None     Source Type: Journal    
DOI: 10.1046/j.1365-2818.2001.00789.x     Document Type: Review
Times cited : (10)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.