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Volumn 148, Issue 1, 2001, Pages

X-ray photoelectron spectroscopy study on the chemical composition of copper tarnish products formed at low humidities

Author keywords

[No Author keywords available]

Indexed keywords

ARGON; COMPOSITION EFFECTS; SPUTTERING; THERMAL EFFECTS; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 0035129746     PISSN: 00134651     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.1344547     Document Type: Article
Times cited : (56)

References (21)
  • 8
    • 0342575862 scopus 로고
    • J. D. Sinclair, Editor, PV 91-2, The Electrochemical Society Proceedings Series, Pennington, NJ
    • M. Seo, I. Sawamura, and N. Sato, in Corrosion of Electronic Materials and Devices, J. D. Sinclair, Editor, PV 91-2, p. 165, The Electrochemical Society Proceedings Series, Pennington, NJ (1991).
    • (1991) Corrosion of Electronic Materials and Devices , pp. 165
    • Seo, M.1    Sawamura, I.2    Sato, N.3
  • 10
    • 33847600596 scopus 로고    scopus 로고
    • Ph.D. Thesis, Complutense University of Madrid
    • L. Mariaca, Ph.D. Thesis, Complutense University of Madrid (1997).
    • (1997)
    • Mariaca, L.1
  • 16
    • 0003828439 scopus 로고
    • John \lley & Sons, Ltd., Chichester, England
    • D. Briggs and M. P. Seah, Practical Surface Analysis, p. 635, John \lley & Sons, Ltd., Chichester, England (1990).
    • (1990) Practical Surface Analysis , pp. 635
    • Briggs, D.1    Seah, M.P.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.