Fault detection and location using I DD waveform analysis

IEEE Design and Test of Computers

Volumn 18, Issue 1, 2001, Pages 42-49

  Muhammad, Khurram ^b   Roy, Kaushik ^a  

^a PURDUE UNIVERSITY   (United States)

^b TEXAS INSTRUMENTS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AT SPEED TEST UNIT; CIRCUIT UNDER TEST; CURRENT WAVEFORM BASED ANALYSIS; FAULT DETECTION; INTEGRATOR BASED WAVEFORM COMPARISON METHOD; SOFTWARE PACKAGE HSPICE;

CMOS INTEGRATED CIRCUITS; COMPUTER SIMULATION; FAST FOURIER TRANSFORMS; FAULT TREE ANALYSIS; INTEGRATING CIRCUITS; LEAKAGE CURRENTS; POLYNOMIALS; SHIFT REGISTERS;

INTEGRATED CIRCUIT TESTING;

EID: 0035127378     PISSN: 07407475     EISSN: None     Source Type: Journal    
DOI: 10.1109/54.902821     Document Type: Article

References (10)

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