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Volumn 169-170, Issue , 2001, Pages 415-419

Hexagonal boron nitride film substrate for fabrication of nanostructures

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; AUGER ELECTRON SPECTROSCOPY; BORON COMPOUNDS; CRYSTAL LATTICES; MAGNETRON SPUTTERING; NANOSTRUCTURED MATERIALS; SCANNING TUNNELING MICROSCOPY; SEGREGATION (METALLOGRAPHY); SUBSTRATES; SYNTHESIS (CHEMICAL); VAN DER WAALS FORCES; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 0035126814     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(00)00695-4     Document Type: Article
Times cited : (5)

References (11)
  • 3
    • 0003372760 scopus 로고
    • Properties of Group 111 Nitride
    • Inspec Publication, London
    • J.H. Edger, Properties of Group 111 Nitride, EMIS Data Reviews Series, No. 11, Inspec Publication, London, 1994.
    • (1994) EMIS Data Reviews Series , vol.11
    • Edger, J.H.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.