First pass TWT design success

IEEE Transactions on Electron Devices

Volumn 48, Issue 1, 2001, Pages 176-178

  Benton, Robert T ^a   Chong, C K ^a   Menninger, William L ^a   Thorington, Charles B ^a   Zhai, Xiaoling ^a   Komm, David S ^a   Dayton, James A ^a  

^a BOEING COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; INTEGRATED CIRCUIT LAYOUT; ITERATIVE METHODS; OPTIMIZATION; PHASE SHIFT; SEMICONDUCTOR DEVICE MANUFACTURE; SEMICONDUCTOR DEVICE MODELS;

HUGHES ELECTRON DYNAMICS; SLOW WAVE CIRCUITS;

TRAVELING WAVE TUBES;

EID: 0035124680     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/16.892187     Document Type: Article

References (2)

1. C. L. Kory and J. A. Dayton, Jr., Accurate cold-test model of helical TWT slow-wave circuits, IEEE Trans. Electron Devices, vol. 45, pp. 966-971, Apr. 1998.
2. R. T. Longo, 1EDM Tech. Dig.. 1984.